Title :
A sparse texture representation using local affine regions
Author :
Lazebnik, Svetlana ; Schmid, Cordelia ; Ponce, Jean
Author_Institution :
Beckman Inst., Illinois Univ., Urbana, IL, USA
Abstract :
This paper introduces a texture representation suitable for recognizing images of textured surfaces under a wide range of transformations, including viewpoint changes and nonrigid deformations. At the feature extraction stage, a sparse set of affine Harris and Laplacian regions is found in the image. Each of these regions can be thought of as a texture element having a characteristic elliptic shape and a distinctive appearance pattern. This pattern is captured in an affine-invariant fashion via a process of shape normalization followed by the computation of two novel descriptors, the spin image and the RIFT descriptor. When affine invariance is not required, the original elliptical shape serves as an additional discriminative feature for texture recognition. The proposed approach is evaluated in retrieval and classification tasks using the entire Brodatz database and a publicly available collection of 1,000 photographs of textured surfaces taken from different viewpoints.
Keywords :
computer vision; image recognition; image representation; image texture; visual databases; Brodatz database; Laplacian regions; affine-invariant fashion; distinctive appearance pattern; elliptic shape; elliptical shape; feature extraction; local affine regions; shape normalization; sparse set; sparse texture representation; texture element; texture recognition; Detectors; Feature extraction; Image analysis; Image databases; Image recognition; Image texture analysis; Information retrieval; Shape; Spatial databases; Surface texture; Index Terms- Image processing and computer vision; feature measurement; pattern recognition.; texture; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Graphics; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.151