DocumentCode
939160
Title
DAC Highlights
Author
Sapatnekar, Sachin ; Martin, Grant
Author_Institution
University of Minnesota
Volume
23
Issue
3
fYear
2006
Firstpage
182
Lastpage
184
Abstract
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Keywords
DAC; Design Automation Conference; Circuits; Design for manufacture; Electronic design automation and methodology; Embedded software; Failure analysis; Formal verification; Performance analysis; Signal design; System-on-a-chip; Testing; DAC; Design Automation Conference;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2006.66
Filename
1634284
Link To Document