Author :
Sapatnekar, Sachin ; Martin, Grant
Author_Institution :
University of Minnesota
Abstract :
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Keywords :
DAC; Design Automation Conference; Circuits; Design for manufacture; Electronic design automation and methodology; Embedded software; Failure analysis; Formal verification; Performance analysis; Signal design; System-on-a-chip; Testing; DAC; Design Automation Conference;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.66
