Title :
The Theory of Low-Temperature Bolometer Detectors Applied to the Measurement of Low-Level RF Power
Author :
Birx, D.L. ; Fuschillo, N.
Author_Institution :
Franklin Institute Labs., Philadelphia 3, Pa.
Keywords :
Bolometers; Detectors; Electromagnetic heating; Fluctuations; Power measurement; Radio frequency; Resistance heating; Semiconductor device noise; Superconducting device noise; Temperature;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1958.5006806