DocumentCode :
939539
Title :
Estimation of polarization crosstalk at a micro-bend in Si-photonic wire waveguide
Author :
Sakai, Atsushi ; Fukazawa, Tatsuhiko ; Baba, Toshihiko
Author_Institution :
Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Japan
Volume :
22
Issue :
2
fYear :
2004
Firstpage :
520
Lastpage :
525
Abstract :
The singlemode Si-photonic wire waveguide allows sharp bends, which significantly expands the design flexibility of optical devices and circuits. Here, the suppression of the polarization crosstalk at a sharp bend will be an important issue, since a large crosstalk affects the performance of devices and circuits. In this study, the three-dimensional (3-D) finite-difference time-domain (FDTD) simulation showed that the crosstalk at a 90°-bend with a radius of 0.35-1.75 μm is less than -25 dB at a wavelength of 1.55 μm. In the experiment, the crosstalk from TE-like to TM-like polarization was evaluated to be -13 dB to -10 dB. This large value was explained by a small tilt of waveguide sidewalls, which seriously increased the crosstalk. In addition, it was found in the calculation that some combinations of bends increase or decrease the crosstalk, and that a U-shape bend is the most effective for the suppression of the crosstalk.
Keywords :
elemental semiconductors; finite difference time-domain analysis; light polarisation; optical crosstalk; optical design techniques; optical fabrication; optical losses; optical waveguides; silicon; silicon-on-insulator; FDTD; Si; Si-photonic wire waveguide; TE-like polarization; TM-like polarization; U-shape bend; design flexibility; microbend; optical devices; polarization crosstalk; three-dimensional finite-difference time-domain simulation; Circuit simulation; Crosstalk; Finite difference methods; Flexible printed circuits; Optical design; Optical devices; Optical polarization; Optical waveguides; Time domain analysis; Wire;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2004.824357
Filename :
1278494
Link To Document :
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