Title :
Electrical characterisation of transferred-electron devices
Author :
McBretney, J. ; Howes, M.J.
Author_Institution :
University of Leeds, Department of Electrical & Electronic Engineering, Leeds, UK
Abstract :
A technique is presented that enables the chip admittance of stable t.e.d.s (t.e.a.s) to be determined accurately in any microwave circuit. An extension of the technique for the characterisation of oscillating t.e.d.s (t.e.o.s) is discussed.
Keywords :
solid-state microwave devices; transferred electron devices; TEDs; microwave circuit;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19760404
