DocumentCode :
939656
Title :
High slew rate ´channel equalized´ DC SQUID flux-locked loop: concept and simulation
Author :
Gershenson, M. ; McDonald, R.J.
Author_Institution :
US Naval Surface Warfare Center, Panama City, FL, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
1832
Lastpage :
1836
Abstract :
The concept of improving conventional DC superconducting quantum interference device (SQUID) flux-locked loop (FLL) performance by applying a channel equalization circuit after the pre-amp, but prior to the demodulation process in order to compensate for bandwidth limitations imposed by conventional DC SQUID impedance matching networks is discussed. The equalization circuit is a bandlimited inverse filter which corrects for the phase and amplitude distortion caused primarily by the DC SQUID impedance matching network. Improvements in the FLL performance were verified with analog circuit simulations in both the time and frequency domains. Using an analog circuit simulator the various subcircuits of the FLL were modeled, and a comparison between a conventional FLL and an equalized one was performed. Computer simulations for the open and closed loop cases were used to quantify the increase in slew rate for the equalized FLL system.<>
Keywords :
SQUIDs; active filters; circuit analysis computing; equalisers; frequency-domain analysis; impedance matching; time-domain analysis; DC SQUID flux-locked loop; FLL subcircuits; amplitude distortion; analog circuit simulations; bandlimited inverse filter; bandwidth limitations; channel equalization circuit; closed loop step response; demodulation; frequency domain simulation; impedance matching networks; open loop group delay; phase distortion; slew rate; time domain simulation; Analog circuits; Circuit simulation; Computational modeling; Demodulation; Frequency locked loops; Impedance matching; Interference; SQUIDs; Superconducting devices; Superconducting filters;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233325
Filename :
233325
Link To Document :
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