Title :
Aperture Corrective Systems
Author :
Otterman, Joseph
Author_Institution :
University of Michigan, Ann Arbor, Mich.
fDate :
3/1/1959 12:00:00 AM
Keywords :
Apertures; Electron beams; Helium; Instruments; Oscilloscopes; Pressure measurement; Smoothing methods; Strain measurement; Stress measurement; TV;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1959.5006828
