DocumentCode :
939807
Title :
Design of universal test sequences for VLSI
Author :
Lempel, Abraham ; Cohn, Martin
Volume :
31
Issue :
1
fYear :
1985
fDate :
1/1/1985 12:00:00 AM
Firstpage :
10
Lastpage :
17
Abstract :
A test sequence is called 
-universal if it exercises every function depending on t or fewer inputs on a very large scale integration (VLSI) chip with 
inputs. Randomized and deterministic procedures are deseribed for the design of -universal sequences and for the signature analysis of the test outputs.
-universal if it exercises every function depending on t or fewer inputs on a very large scale integration (VLSI) chip with inputs. Randomized and deterministic procedures are deseribed for the design of -universal sequences and for the signature analysis of the test outputs.Keywords :
Integrated circuit testing; Shift-register sequences; VLSI; Very large-scale integration (VLSI); Binary sequences; Computer science; Cost function; Feedback; Input variables; Logic functions; Logic testing; Shift registers; System testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/TIT.1985.1057003
Filename :
1057003
Link To Document :
