DocumentCode
939920
Title
Closed-form expressions for extending step delay and slew metrics to ramp inputs for RC trees
Author
Kashyap, Chandramouli V. ; Alpert, Charles J. ; Liu, Frank ; Devgan, Anirudh
Author_Institution
Flexlogics Inc., Sunnyvale, CA, USA
Volume
23
Issue
4
fYear
2004
fDate
4/1/2004 12:00:00 AM
Firstpage
509
Lastpage
516
Abstract
Recent years have seen significant research in finding closed form expressions for the delay of an RC circuit that improves upon the Elmore delay model. However, several of these formulae assume a step excitation, leaving it to the reader to find a suitable extension to ramp-we always refer to saturated ramps in this paper-inputs. The few works that do consider ramp inputs do not present a closed-form formula that works for a wide range of possible input slews. We propose the PERI (probability distribution function extension for ramp inputs) technique, that extends delay metrics for step inputs to the more general and realistic non-step (such as a ramp) inputs. Although there has been little work done in finding good slew (which is also referred as signal transition time) metrics, we also show how one can extend a slew metric for step inputs to the non-step case. We validate the efficacy of our approach through experimental results from several hundred RC dominated nets extracted from an industry application specific integrated circuit design.
Keywords
RC circuits; circuit CAD; delay circuits; integrated circuit design; probability; Elmore delay model; RC circuit delay; RC dominated nets; RC trees; closed-form expressions; delay metrics; integrated circuit design; probability distribution function extension; ramp inputs; saturated ramps; signal transition time; slew metrics; step delay; step excitation; step inputs; Closed-form solution; Delay estimation; Industry applications; Integrated circuit interconnections; Integrated circuit synthesis; Optimization; Physics computing; Probability distribution; Routing; Wire;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2004.825861
Filename
1278528
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