DocumentCode :
939941
Title :
Microstructure, resistivity and critical currents of Ag-Bi/Pb(2223) tapes
Author :
Hensel, B. ; Grivel, J.-C. ; Jeremie, A. ; Perin, A. ; Pollini, A. ; Liniger, F. ; Flukiger, R.
Author_Institution :
Geneva Univ., Switzerland
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
1139
Lastpage :
1142
Abstract :
The temperature and field dependences of critical current density, j/sub c/, in Ag-Bi/Pb(2223) tapes, prepared by the standard powder-in-tube method, have been measured between 4.2 K and 110 K in magnetic fields up to 15 T. The j/sub c/´s reproducibly reached values up to 20000 A/cm/sup 2/ at 77.35 K in zero magnetic field. After stripping or etching away the Ag-sheath, the microstructure of the superconductor core has been investigated by SEM, EDX and X-ray diffraction. On etched samples the resistance of the Bi(2223) filament has been measured. A value below 500 mu Omega -cm has been found for the resistivity at 130 K.<>
Keywords :
X-ray chemical analysis; X-ray diffraction examination of materials; bismuth compounds; calcium compounds; ceramics; critical current density (superconductivity); crystal microstructure; etching; high-temperature superconductors; lead compounds; magnetic field effects; powder technology; scanning electron microscope examination of materials; silver; strontium compounds; 130 K; 15 T; 4.2 to 110 K; Ag-(BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10+y/; EDX; HTSC; SEM; X-ray diffraction; critical currents; etched samples; magnetic fields; microstructure; resistivity; standard powder-in-tube method; Conductivity; Critical current; Critical current density; Current measurement; Density measurement; Etching; Magnetic field measurement; Measurement standards; Microstructure; Temperature dependence;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233353
Filename :
233353
Link To Document :
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