Title :
Comparison of Deviations from Square Law for RF Crystal Diodes and Barretters
Author :
Sorger, G.U. ; Weinschel, B.O.
Author_Institution :
Weinschel Engineering, Kensington, Md.
Keywords :
Attenuation measurement; Detectors; Diodes; Extraterrestrial measurements; Loss measurement; Microwave devices; Microwave measurements; Radio frequency; Temperature; Voltage;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1959.5006859
