• DocumentCode
    940038
  • Title

    The role of Sn addition on the improvement of J/sub c/ in PbMo/sub 6/S/sub 8/

  • Author

    Selvam, P. ; Cattani, D. ; Cors, J. ; Decroux, M. ; Niedermann, P. ; Fischer, O. ; Chevrel, R. ; Pech, T.

  • Author_Institution
    Dept. de Phys. de la Matiere Condensee, Geneve Univ., Switzerland
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1575
  • Lastpage
    1578
  • Abstract
    The influence of Sn on the enhancement of critical current densities, J/sub c/, in bulk samples of PbMo/sub 6/S/sub 8/ has been systematically investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), Auger electron spectroscopy (AES), AC susceptibility, and specific heat experiments. The results indicate that the addition of Sn, as an adjunction (dopant) or as a substitution, has a considerable effect on the structural, superconducting, microstructural and grain boundary properties. The observed increase in J/sub c/ is discussed in terms of improved interconnectivity between the grains, better homogeneity of the samples, and, more importantly, lower grain boundary contamination.<>
  • Keywords
    Auger effect; X-ray diffraction examination of materials; critical current density (superconductivity); grain boundaries; lead compounds; molybdenum compounds; scanning electron microscope examination of materials; specific heat of solids; tin compounds; type II superconductors; AC susceptibility; AES; Auger electron spectroscopy; Pb/sub 1-x/Sn/sub x/Mo/sub 6/S/sub 8/; PbMo/sub 6/S/sub 8/; SEM; X-ray diffraction; adjunction; bulk samples; critical current densities; dopant; grain boundary properties; grain interconnectivity; homogeneity; lower grain boundary contamination; microstructural properties; scanning electron microscopy; specific heat; structural properties; substitution; superconducting properties; Contamination; Critical current density; Grain boundaries; Lattices; Scanning electron microscopy; Spectroscopy; Superconducting magnets; Tin; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233363
  • Filename
    233363