Title :
Surface characterization of a-axis EuBa/sub 2/Cu/sub 3/O/sub 7-y/ thin films
Author :
Asano, H. ; Asahi, M. ; Suzuki, M. ; Kimachi, Y.
Author_Institution :
NTT Interdisciplinary Res. Lab., Ibaraki, Japan
fDate :
3/1/1993 12:00:00 AM
Abstract :
The surface characterization of a-axis EuBa/sub 2/Cu/sub 3/O/sub 7-y/ (EBCO) films sputtered onto SrTiO/sub 3/
Keywords :
X-ray photoelectron spectra; atomic force microscopy; barium compounds; europium compounds; high-temperature superconductors; reflection high energy electron diffraction; scanning electron microscope examination of materials; sputtered coatings; superconducting thin films; surface structure; surface treatment; AFM; ECR ion beam treatment; EuBa/sub 2/Cu/sub 3/O/sub 7-y/; RHEED; SEM; SrTiO/sub 3/ substrate; XPS; a-axis films; high temperature superconductors; multilayer devices; smooth surfaces; surface characterization; surface chemistry; surface cleaning; Atomic force microscopy; Electron beams; Fabrication; Ion beams; Nonhomogeneous media; Optical films; Scanning electron microscopy; Surface cleaning; Surface contamination; Surface treatment;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
