Title :
Critical currents in NbZr superconducting thin films
Author :
Gambardella, U. ; Di Gioacchino, D. ; Boffa, V. ; Paterno, G. ; Barbanera, S. ; Murtas, F.
Author_Institution :
ENEA-CRE Frascati, Rome, Italy
fDate :
3/1/1993 12:00:00 AM
Abstract :
The fabrication by sputtering of Nb/sub 0.75/Zr/sub 0.25/ thin films that showed critical temperature as high as 10.5 K is described. Transport critical current measurements on Nb/sub 0.75/Zr/sub 0.25/ films whose geometries were photolithographically defined in the micrometer range are reported. The measurements were performed as a function both of the temperature and of the magnetic field up to 6 T. The temperature behavior is compared with the Kim-Anderson model, and the magnetic field behavior of the resulting pinning force is compared with existing models.<>
Keywords :
critical currents; flux pinning; niobium alloys; superconducting thin films; type II superconductors; zirconium alloys; 10.5 K; Kim-Anderson model; Nb/sub 0.75/Zr/sub 0.25/; critical current; critical temperature; pinning force; sputtering; superconductor; thin films; Critical current; Current measurement; Fabrication; Force measurement; Magnetic field measurement; Niobium; Sputtering; Superconducting thin films; Temperature; Zirconium;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
