DocumentCode :
940420
Title :
Measurements of Microwave Conductivity and Dielectric Constant by the Cavity Perturbation Method and Their Errors
Author :
Chao, Shuh-Han
Volume :
33
Issue :
6
fYear :
1985
fDate :
6/1/1985 12:00:00 AM
Firstpage :
519
Lastpage :
526
Abstract :
The theory and technique of the cavity perturbation method for measuring the conductivity and dielectric constant of materials are reviewed. An analytical formula for calculating the errors of the conductivity and dielectric constant caused by the measured error in the resonant frequency and quality factor are derived. This formula can be used for both rectangular and cylindrical cavities. The results of measurements on silicon samples are presented to illustrate this analysis.
Keywords :
Cavity perturbation methods; Conducting materials; Conductivity measurement; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Microwave measurements; Microwave theory and techniques; Resonant frequency;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1985.1133108
Filename :
1133108
Link To Document :
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