DocumentCode :
940667
Title :
Relaxation l.s.a. mode in InP
Author :
Mun, J. ; Heeks, J.S. ; Clarke, R.C.
Author_Institution :
Standard Telecommunication Limited, Harlow, UK
Volume :
12
Issue :
25
fYear :
1976
Firstpage :
653
Lastpage :
654
Abstract :
What are believed to be the first convincing observations of relaxation l.s.a.-mode operation in InP are reported. Devices fabricated from vapour-phase epitaxial material have shown the characteristic `signatures¿ of the mode in oscillators operated in S- and X-bands. So far, conversion efficiencies have not exceeded those for comparable samples in GaAs, almost certainly owing to remaining material limitations in the relatively thick active layers. The significance of the results lies, in practical terms, in the promise of high-peak-power sources with acceptable efficiencies, and, in diagnostic terms, in the derived information on the magnitude of the fundamental transferred-electron characteristic peak/valley ratio in InP and in achievable material quality factors for thick epitaxial layers.
Keywords :
Gunn diodes; Gunn effect; III-V semiconductors; indium compounds; limited space charge accumulation; semiconductor epitaxial layers; InP; conversion efficiencies; material quality factors; relaxation LSA mode; thick epitaxial layers; transferred electron characteristic ratio;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19760501
Filename :
4240282
Link To Document :
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