Title :
Transport properties of YBaCuO step edge Josephson junctions
Author :
Vildic, M. ; Friedl, G. ; Uhl, D. ; Dallmans, G. ; Kohler, H. ; Meyer, H. ; Bommel, F. ; Saemann-Ischenko, G.
Author_Institution :
Siemens AG, Erlangen, Germany
fDate :
3/1/1993 12:00:00 AM
Abstract :
Step edge Josephson junctions have been prepared on
Keywords :
Josephson effect; SQUIDs; barium compounds; critical current density (superconductivity); flux flow; high-frequency effects; high-temperature superconductors; superconducting thin films; yttrium compounds; 3 to 10 micron; 35 GHz; 4 K; 77 K; SQUID; Shapiro steps; SrTiO/sub 3/ substrate; YBaCu/sub 3/O/sub 7- delta / step edge junction; applied magnetic field; bicrystalline substrates; critical current density; current-voltage characteristics; flux flow; grain boundary junctions; induced microwave current step measurements; interference pattern; microshorts; microwave irradiation; step edge Josephson junctions; superconductor-normal conductor-superconductor; transport properties; Critical current; Current measurement; Current-voltage characteristics; Density measurement; Fluid flow measurement; Josephson junctions; Magnetic field measurement; Microwave measurements; Superconducting microwave devices; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
