Superconducting transport properties of step-edge Josephson junctions

Author

Schmidl, F. ; Alff, L. ; Gross, R. ; Husemann, K.-D. ; Schneidewind, H. ; Seidel, P.

Author_Institution

Tubingen Univ., Germany

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2349

Lastpage

2352

Abstract

The electrical transport properties of YBa/sub 2/Cu/sub 3/O/sub 7- delta / step-edge junctions (SEJs) fabricated on step edges in

Keywords

Josephson effect; barium compounds; critical current density (superconductivity); scanning electron microscope examination of materials; sputter etching; sputtered coatings; superconducting epitaxial layers; superconducting junction devices; superconducting thin films; yttrium compounds; IBE; SrTiO/sub 3/ substrates; YBa/sub 2/Cu/sub 3/O/sub 7- delta / epitaxial film; critical current density; electrical transport properties; film thickness; four-probe electrical measurements; high temperature superconductors; ion beam etching; ow-temperature scanning electron microscopy; patterning; sputtering; step angle; step edge weak links step-edge Josephson junctions; step height; Critical current density; Electric variables measurement; Identity-based encryption; Ion beams; Josephson junctions; Sputter etching; Sputtering; Substrates; Superconducting epitaxial layers; Superconducting films;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233430

Filename

233430