• DocumentCode
    940792
  • Title

    High temperature performance of HTS step-edge DC SQUIDs

  • Author

    Luine, J. ; Burch, J. ; Daly, K. ; Davidhesier, R. ; Hu, R. ; Lee, A. ; Pettiette-Hall, C. ; Schwarzbek, S.

  • Author_Institution
    TRW Space & Technology Group, Redondo Beach, CA, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    2341
  • Lastpage
    2344
  • Abstract
    YBa/sub 2/Cu/sub 3/O/sub 7/ (YBCO) step edge DC superconducting quantum interference devices (SQUIDs) have been developed which exhibit characteristics suitable for near-term incorporation into high-temperature superconductive (HTS) circuitry. Step-edge junction DC SQUIDs for series array interferometer logic (SAIL) digital applications exhibit resistively shunted junction (RSJ) properties, 65 K I/sub c/ values of approximately 150 mu A, 65 K I/sub c/R/sub n/ values up to approximately 300 mu V, and large I/sub c/ modulation (>50%) in accordance with a standard DC SQUID model. 65 K SQUID switching voltages of approximately 100 mu V have been demonstrated and are sufficient for near-term applications of SAIL digital circuitry operating on a cryocooler platform.<>
  • Keywords
    SQUIDs; barium compounds; critical currents; high-temperature superconductors; interferometry; yttrium compounds; 100 muV; 150 muA; 300 muV; 65 K; HTS step edge DC SQUID; LaAlO/sub 3/ substrate; SAIL digital circuitry; YBa/sub 2/Cu/sub 3/O/sub 7/; critical current modulation; cryocooler platform; high-temperature superconductive; resistively shunted junction; series array interferometer logic; standard DC SQUID model; step edge DC superconducting quantum interference devices; switching voltages; High temperature superconductors; Interference; Josephson junctions; Logic arrays; Logic devices; SQUIDs; Superconducting devices; Superconducting logic circuits; Superconductivity; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233432
  • Filename
    233432