DocumentCode :
940879
Title :
Real-Time Quality Evaluation of Wire Bonding Using Input Impedance
Author :
Ling, Shih-Fu ; Zhang, Dong ; Yi, Sung ; Foo, Say Wee
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Univ.
Volume :
29
Issue :
4
fYear :
2006
Firstpage :
280
Lastpage :
284
Abstract :
Input impedance characterizes the dynamic property of a linear system. A few existing technologies thus exploit input electrical impedance of wire bonders as the signature to monitor ultrasonic wire bonding processes. However, the waveforms of "impedance" in these technologies are evaluated only approximately. To overcome the shortcoming, we propose a method to detect the true waveforms of both the real and imaginary part of the input impedance. In the method, the voltage and current at the input port of a wire bonder are probed and processed to obtain impedance via Hilbert Transform. Because dynamics of a bonding process represented by these waveforms is fully responsible for the resulted bonding quality, a quality evaluation system based on pattern recognition of these waveforms is further proposed. An artificial neural network using back propagation as training scheme learns from a set of training data to correlate a few features of the impedance waveforms with the bonding strength of the corresponding bond identified by shearing tests. Through a set of verification data, the built system is validated to be capable of evaluating bonding quality right after a bonding process. The proposed method is not only in situ and real-time, but also sensorless, which means that the system is easy to be implemented without interfering operation
Keywords :
Hilbert transforms; backpropagation; lead bonding; process monitoring; quality control; Hilbert transform; artificial neural network; back propagation; bonding quality; bonding strength; dynamic property; impedance waveforms; input impedance; linear system; pattern recognition; quality evaluation; quality monitoring; shearing tests; training scheme; ultrasonic wire bonding processes; Artificial neural networks; Bonding processes; Impedance; Linear systems; Monitoring; Pattern recognition; Shearing; Training data; Voltage; Wire; Impedance; quality monitoring; wire bonding;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2006.887400
Filename :
4052453
Link To Document :
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