DocumentCode :
941063
Title :
Measurement errors in pattern recognition
Author :
Kittler, Josef
Author_Institution :
Oxford University, Image Analysis Group, Nuclear Physics Laboratory, Oxford, UK
Volume :
127
Issue :
3
fYear :
1980
fDate :
5/1/1980 12:00:00 AM
Firstpage :
81
Lastpage :
84
Abstract :
The effect of measurement errors on the performance of the pattern classifier is studied. It is shown that measurement errors affect the optimality of the decision rule, and can result in higher classification error probability. The results derived in the paper are applied to the problem of quality control of gas meters. It is shown that, to maintain the same quality level of lots of 300 meters, the test sample set size had to be increased from 100 to 160 meters.
Keywords :
pattern recognition; quality control; gas meters; measurement errors; pattern recognition; quality control;
fLanguage :
English
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
Publisher :
iet
ISSN :
0143-7062
Type :
jour
DOI :
10.1049/ip-e.1980.0016
Filename :
4647557
Link To Document :
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