Title :
Data on Temperature Dependence of X-Band Fluorescent Lamp Noise Sources
Author :
Mumford, W.W. ; Schafersman, R.L.
Author_Institution :
Bell Telephone Laboratories, Incorporated, Whippany, New Jersey
Keywords :
Circuits; Fluorescent lamps; Noise figure; Noise measurement; Planar waveguides; Signal to noise ratio; Temperature dependence; Temperature distribution; Temperature measurement; Waveguide components;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1955.5006968
