Title :
A New Precision X-Band Phase-Shifter
Author_Institution :
Hewlett-Packard Company, Palo Alto, California
Keywords :
Attenuators; Calibration; Dielectric materials; Frequency; Instruments; Microwave devices; Phase shifters; Polarization; Slabs; Testing;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1955.5006984
