DocumentCode :
941223
Title :
Improving the large-signal models of bipolar transistors by dividing the intrinsic base into two lateral sections
Author :
Rein, H.-M.
Author_Institution :
Ruhr-Universitÿt Bochum, Institut fÿr Elektronik, Bochum, West Germany
Volume :
13
Issue :
2
fYear :
1977
Firstpage :
40
Lastpage :
41
Abstract :
In large-signal transistor models, the lateral voltage drop across the base region is usually represented by a single-lump constant base spreading resistance. The letter demonstrates, for the switching mode, that a much better approximation of the 2-dimensional transistor can already be achieved by dividing the intrinsic base into merely two sections (2-section model).
Keywords :
bipolar transistors; semiconductor device models; bipolar transistors; intrinsic base lateral sections; large signal models;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19770029
Filename :
4240355
Link To Document :
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