• DocumentCode
    941371
  • Title

    Broad-Band Permittivity Measurements Using the Semi-Automatic Network Analyzer (Short Paper)

  • Author

    Ness, John

  • Volume
    33
  • Issue
    11
  • fYear
    1985
  • fDate
    11/1/1985 12:00:00 AM
  • Firstpage
    1222
  • Lastpage
    1226
  • Abstract
    This paper outlines the use of the network analyzer to measure the dielectric properties of materials over a broad frequency range. The method described here is based on transmission techniques with simple procedures for obtaining initial estimates and unambiguous solutions for the dielectric parameters. A further feature is that this measurement technique provides a degree of self-checking for inconsistent results.
  • Keywords
    Calibration; Coaxial components; Couplers; Couplings; Dielectric losses; Dielectric materials; Dielectric measurements; Erbium; Microstrip; Permittivity measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1985.1133198
  • Filename
    1133198