Title :
Word-Level Predicate-Abstraction and Refinement Techniques for Verifying RTL Verilog
Author :
Jain, Himanshu ; Kroening, Daniel ; Sharygina, Natasha ; Clarke, Edmund M.
Author_Institution :
Dept. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA
Abstract :
As a first step, most model checkers used in the hardware industry convert a high-level register-transfer-level (RTL) design into a netlist. However, algorithms that operate at the netlist level are unable to exploit the structure of the higher abstraction levels and, thus, are less scalable. The RTL of a hardware description language such as Verilog is similar to a software program with special features for hardware design such as bit-vector arithmetic and concurrency. This paper uses predicate abstraction, a software verification technique, for verifying RTL Verilog. There are two challenges when applying predicate abstraction to circuits: 1) the computation of the abstract model in presence of a large number of predicates and 2) the discovery of suitable word-level predicates for abstraction refinement. We address the first problem using a technique called predicate clustering. We address the second problem by computing the weakest preconditions of Verilog statements in order to obtain new word-level predicates during abstraction refinement. We compare the performance of our technique with localization reduction, a netlist-level abstraction technique, and report improvements on a set of benchmarks.
Keywords :
hardware description languages; performance evaluation; program verification; RTL Verilog; bit-vector arithmetic; concurrency; hardware description language; high-level register-transfer-level design; netlist-level abstraction technique; predicate clustering; refinement techniques; word-level predicate-abstraction; Model checking (MC); Register transfer level (RTL), , , , , .; model checking; predicate abstraction; refinement; register transfer level (RTL); satisfiability (SAT); verification;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2007.907270