Microwave losses in kinetic-inductance devices fabricated from NbCN/MgO/NbCN trilayers

Author

Carroll, K.R. ; Pond, J.M. ; Cukauskas, E.J.

Author_Institution

US Naval Res. Lab., Washington, DC, USA

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2808

Lastpage

2811

Abstract

The microwave losses in kinetic-inductance devices fabricated from NbCN/MgO/NbCN trilayers are being investigated. The loss tangent of an amorphous MgO thin film has been measured for frequencies near 10 GHz with a kinetic-inductance stub filter. The value of 0.0031 represents a factor of approximately 3 improvement over Si:H films found for a similar kinetic-inductance structure operating in a similar frequency range. Further improvement in the dielectric is also discussed. Other properties of the superconducting trilayer structure are consistent with previous results.<>

Keywords

dielectric losses; magnesium compounds; microstrip components; microwave filters; niobium compounds; passive filters; superconducting junction devices; superconducting microwave devices; 10 GHz; NbCN-MgO-NbCN trilayers; SHF; SIS structure; amorphous MgO thin film; dielectric; kinetic-inductance devices; loss tangent; microwave losses; stub filter; superconducting trilayer structure; Amorphous materials; Dielectric loss measurement; Dielectric measurements; Dielectric thin films; Frequency measurement; Loss measurement; Microwave devices; Superconducting films; Superconducting filters; Superconducting microwave devices;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233498

Filename

233498