• DocumentCode
    941640
  • Title

    Performance issues in single flux quantum shift registers

  • Author

    Hang, J.H. ; Przybysz, J.X.

  • Author_Institution
    Westinghouse Sci. & Technol. Center, Pittsburgh, PA, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    2752
  • Lastpage
    2755
  • Abstract
    Testing on a single-flux-quantum (SFQ) shift register fabricated with a SFQ Nb-AlO/sub x/Nb Josephson junction process indicates that a stable flux quantum can be stored in a rapid SFQ (RSFQ) shift register stage and be shifted by SFQ pulses. Design simulations showed that logic errors can occur in SFQ shift registers even though the circuit passes the average voltage test. Three-junction-per-stage shift registers had an advantage over the two-junction-per-stage shift register in handling data with successive 1´s and in incorporating resistors to increase tolerance of trapped magnetic flux. Input and output buffers for data and clock pulses were added to get an RSFQ shift register to obtain correct performance. The highest error-free operation speed for the data with successive 1´s is about half of the speed for propagation of a lone data 1. Error-free operation of SFQ shift registers with three junctions per stage could be obtained up to speeds of 30-60 GHz with Josephson junctions having I/sub c/R/sub n/ (critical-current-normal-resistance product) values of 600 mu V.<>
  • Keywords
    Josephson effect; shift registers; superconducting junction devices; superconducting logic circuits; 30 to 60 GHz; Josephson junction process; Nb-AlO/sub x/Nb; SFQ pulses; buffers; error-free operation; logic errors; shift registers; single flux quantum; trapped magnetic flux; Circuit simulation; Circuit testing; Error-free operation; Josephson junctions; Logic circuits; Logic design; Logic testing; Niobium; Shift registers; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233511
  • Filename
    233511