• DocumentCode
    941654
  • Title

    Low-Loss Thin Film Microstrip Lines and Filters Based on Magnetorheological Finishing

  • Author

    Lee, Sang-No ; Lee, Joon-Ik ; Kim, Yong-Jun ; Yook, Jong-Gwan

  • Author_Institution
    Yonsei Univ., Seoul
  • Volume
    30
  • Issue
    4
  • fYear
    2007
  • Firstpage
    849
  • Lastpage
    854
  • Abstract
    This paper presents a surface finishing method based on magnetorheological fluid to obtain low-loss high-frequency transmission lines and filters on CMOS-grade silicon. As specimens for the magnetorheological finishing, high- and low- thin film microstrip lines with a 20 m-thick polyimide interface above the ground plane that is patterned on the silicon substrate are evaluated. In all cases, thin film microstrip lines treated with the magnetorheological finishing scheme reveal much lower losses compared to original lines owing to reduced conductor roughness. In addition, low-pass filters with 0.5 dB Chebyshev responses based on high-Z0 and low-Z0 thin film microstrip lines are designed and characterized before and after applying the magnetorheological finishing treatment, exhibiting a roughly 1.0-dB insertion loss improvement for the entire pass band range. The proposed magnetorheological finishing scheme can be applied to smoothen any 3-D high-frequency structures, and it can significantly improve conductor roughness.
  • Keywords
    magnetic fluids; magnetorheology; microstrip filters; microstrip lines; silicon; surface finishing; 3D high-frequency structures; CMOS-grade silicon; Si - Interface; high-frequency transmission lines; low-loss thin film; low-pass filters; magnetorheological finishing; magnetorheological fluid; microstrip filters; microstrip lines; polyimide interface; reduced conductor roughness; size 20 mum; surface finishing; CMOS-grade silicon; conductor roughness; magnetorheological finishing; magnetorheological fluid; thin film microstrip lines;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2007.906700
  • Filename
    4358432