New RSFQ circuits (Josephson junction digital devices)

Author

Polonsky, S.V. ; Semenov, V.K. ; Bunyk, P.I. ; Kirichenko, A.F. ; Kidiyarov-Shevchenko, A.Yu. ; Mukhanov, O.A. ; Shevchenko, P.N. ; Schneider, D.F. ; Zinoviev, D.Y. ; Likharev, K.K.

Author_Institution

Moscow State Univ., Russia

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2566

Lastpage

2577

Abstract

Several novel circuits of the rapid single-flux-quantum (RSFQ) family of Josephson-junction digital devices have been designed, fabricated using a 2.5- mu m 1000-A/cm/sup 2/ Nb trilayer technology, and tested at low frequencies. Numerical simulation and measurements have shown that these circuits have considerably wider parameter margins, due to application of several novel design methods. The authors have also carried out an experiment to measure the rate of errors in a simple RSFQ circuit including an inverter, confluence buffer, and Josephson transmission line. Near the middle of the parameter window at 4.2 K, the error probability was definitely lower than 3*10/sup -15/ per logic operation, despite experimentation with rudimentary shielding and filtering.<>

Keywords

Josephson effect; digital integrated circuits; flip-flops; superconducting junction devices; superconducting logic circuits; superconducting memory circuits; 2.5 micron; 4.2 K; Josephson transmission line; Josephson-junction digital devices; Nb trilayer technology; RSFQ circuits; confluence buffer; error probability; error rate; filtering; inverter; rapid single-flux-quantum; shielding; Circuit testing; Design methodology; Distributed parameter circuits; Error probability; Frequency; Inverters; Josephson junctions; Niobium; Numerical simulation; Transmission line measurements;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233530

Filename

233530