DocumentCode
941956
Title
Intrinsic response time and related quantities describing semiconductor avalanches
Author
Iperen, B. B Van ; Goedbloed, J.J.
Author_Institution
Philips Research Laboratories, Eindhonven, Netherlands
Volume
13
Issue
15
fYear
1977
Firstpage
448
Lastpage
449
Abstract
Two definitions of the intrinsic response time of a semi-conductor avalanche are in use which have not yet been very well distingusihed. It is shown that these response times and related quantities, such as the `average¿ or `effective¿ ionisation rate ¿¿, and its field derivative ¿¿, occur in well defined families. Among other things, it is shown that an accepted expression for ¿¿ is not consistent with either of these two response times.
Keywords
impact ionisation; semiconductors; effective ionisation rate; impact ionisation; intrinsic response time; semiconductor avalanches;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19770324
Filename
4240440
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