• DocumentCode
    941956
  • Title

    Intrinsic response time and related quantities describing semiconductor avalanches

  • Author

    Iperen, B. B Van ; Goedbloed, J.J.

  • Author_Institution
    Philips Research Laboratories, Eindhonven, Netherlands
  • Volume
    13
  • Issue
    15
  • fYear
    1977
  • Firstpage
    448
  • Lastpage
    449
  • Abstract
    Two definitions of the intrinsic response time of a semi-conductor avalanche are in use which have not yet been very well distingusihed. It is shown that these response times and related quantities, such as the `average¿ or `effective¿ ionisation rate ¿¿, and its field derivative ¿¿, occur in well defined families. Among other things, it is shown that an accepted expression for ¿¿ is not consistent with either of these two response times.
  • Keywords
    impact ionisation; semiconductors; effective ionisation rate; impact ionisation; intrinsic response time; semiconductor avalanches;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19770324
  • Filename
    4240440