• DocumentCode
    942223
  • Title

    Radiation-induced degradation of ohmic contacts

  • Author

    Blundell, R. ; Morgan, D.V. ; Howes, M.J.

  • Author_Institution
    University of Leeds, Department of Electrical & Electronic Engineering, Leeds, UK
  • Volume
    13
  • Issue
    16
  • fYear
    1977
  • Firstpage
    483
  • Lastpage
    484
  • Abstract
    Ohmic contacts can be severely degraded by the introduction of small amounts of radiation damage at the metal-semiconductor interface. This can lead to failure of GaAs transferred-electron devices; a safe limit for proton bombardment of ohmic contacts is proposed.
  • Keywords
    Gunn devices; ohmic contacts; proton effects; ohmic contact degradation; proton bombardment; radiation damage; transferred electron devices;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19770349
  • Filename
    4240469
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=942223