Title :
Single-electron tunneling transistors incorporating Cooper pair processes
Author :
Tuominen, M.T. ; Hergenrother, J.M. ; Tighe, T.S. ; Tinkham, M.
Author_Institution :
Dept. of Phys., Harvard Univ., Cambridge, MA, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
A superconducting single-electron tunneling transistor composed of two ultrasmall capacitance Al/Al/sub 2/O/sub 3//Al tunnel junctions and a capacitively coupled gate electrode has been fabricated. Transistor operation is based on single electron and Cooper pair charging effects. This three-terminal device exhibits novel I-V characteristics not seen in either conventional superconducting tunnel junctions or normal metal Coulomb blockage devices. Current peaks appear above V approximately 2 Delta /e which originate from combined Cooper pair/quasi-particle tunneling processes. These peaks show e-periodic modulation with respect to the gate-induced charge. At lower voltages, the I-V curve shows features which are 2e-periodic. In a magnetic field, it is found that the 2e-periodicity changes into e-periodicity above a crossover line, T*(H). The data strongly suggest the existence of a free energy difference between states with an even versus an odd number of electrons on the metal island between the two junctions.<>
Keywords :
Cooper pairs; alumina; aluminium; superconducting junction devices; superconductive tunnelling; transistors; 2e-periodicity; Al-Al/sub 2/O/sub 3/-Al; Cooper pair processes; Cooper pair/quasi-particle tunneling processes; I-V characteristics; capacitively coupled gate electrode; charging effects.; crossover line; current peaks; e-periodic modulation; e-periodicity; free energy difference; gate-induced charge; magnetic field; metal island; superconducting single-electron tunneling transistor; three-terminal device; ultrasmall capacitance Al/Al/sub 2/O/sub 3//Al tunnel junctions; Artificial intelligence; Capacitance; Electrodes; Josephson junctions; Magnetic field measurement; Physics; Single electron transistors; Superconducting films; Tunneling; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on