DocumentCode :
942371
Title :
A high resolution imaging susceptometer
Author :
Ma, Y.P. ; Thomas, I.M. ; Lauder, A. ; Wikswo, J.P., Jr.
Author_Institution :
Dept. of Phys. & Astron., Vanderbilt Univ., Nashville, TN, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
1941
Lastpage :
1944
Abstract :
A high-resolution, MicroSQUID (superconducting quantum interference device)-based susceptometer has been constructed for imaging the susceptibility distribution in diamagnetic and paramagnetic objects. The maximum available applied field, produced by the Helmholtz pair, is 300 mu T, which provides an adequate signal-to-noise ratio for common susceptible materials. The calculated variation in the applied field within 20 mm of the center is less than 0.1% of the field at the center. In a 100-Hz bandwidth, the minimum detectable susceptibility-induced field change, (limited by SQUID noise) is 3*10/sup -9/ of the applied field. The sensitivity of the system may be improved by increasing the applied field, for instance by incorporating a superconducting magnet into the magnetometer dewar, and by using lower-noise SQUIDs.<>
Keywords :
SQUIDs; diamagnetism; magnetic field measurement; magnetic susceptibility; magnetometers; nondestructive testing; paramagnetism; 100 Hz; 300 muT; Helmholtz pair; MicroSQUID; NDE; SQUID noise; applied field; diamagnetic objects; high resolution imaging susceptometer; magnetometer dewar; minimum detectable susceptibility-induced field change; paramagnetic objects; sensitivity; signal-to-noise ratio; superconducting magnet; superconducting quantum interference device; susceptibility distribution; Bandwidth; High-resolution imaging; Interference; Paramagnetic materials; SQUIDs; Signal to noise ratio; Superconducting device noise; Superconducting devices; Superconducting magnets; Superconducting materials;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233580
Filename :
233580
Link To Document :
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