Title :
Reliability of Quantity Produced Transistors in Low Power Audio Applications
Author_Institution :
Raytheon Manufacturing Company, Newton, Massachusetts
Keywords :
Auditory system; Cities and towns; Encapsulation; Failure analysis; Humidity measurement; Manufacturing; Plastics; Power system reliability; Temperature distribution; Testing;
Journal_Title :
Reliability and Quality Control, Transactions of the IRE Professional Group on
DOI :
10.1109/IRE-PGQC.1954.5007119
