Title :
Reliability Indices for Missile Electronic Component Parts
Author :
Bills, Thomas S.
Author_Institution :
Applied Physics Laboratory, The Johns Hopkins University, Silver Spring, Maryland
fDate :
6/1/1957 12:00:00 AM
Keywords :
Capacitors; Circuits; Electron tubes; Electronic components; Failure analysis; Laboratories; Missiles; Physics; Relays; Resistors;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1957.5007128
