Title :
Synthesis and microwave characterisation of DC sputtered Tl-Ba-Ca-Cu-O thin films
Author :
Morley, S.M. ; Jenkins, A.P. ; Su, L.Y. ; Adams, M.J. ; Dew-Hughes, D. ; Grovenor, C.R.M.
Author_Institution :
Oxford Univ., UK
fDate :
3/1/1993 12:00:00 AM
Abstract :
Single- and double-sided superconducting Tl-Ba-Ca-Cu-O thin films (2- mu m thick) have been prepared on MgO
Keywords :
X-ray diffraction examination of materials; barium compounds; critical current density (superconductivity); electric resistance measurement; g-factor; high-temperature superconductors; microwave measurement; scanning electron microscope examination of materials; sputter deposition; superconducting transition temperature; surface conductivity; thallium compounds; 18 to 200 K; 2 micron; 3.2 GHz; 50 GHz; 60 GHz; 77 K; 90 to 110 K; Ag; DC sputtering; LaAlO/sub 3/ substrate; MgO substrate; Q values; SEM; TE/sub 01/ mode cavity end wall replacement technique; Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10/ thin film; X-ray diffraction; double sided HTS film; microwave characterisation; patterned resonator structures; single sided superconducting film; surface resistance; transport critical current densities; two-step anneal process; Annealing; Critical current density; Electrical resistance measurement; Q measurement; Sputtering; Superconducting films; Superconducting microwave devices; Superconducting thin films; Surface resistance; Temperature distribution;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
