DocumentCode :
942530
Title :
Naval Material Laboratory Transistor Reliability Study
Author :
Martin, R.E.
Author_Institution :
New York Naval Shipyard, Brooklyn, New York
fYear :
1957
fDate :
6/1/1957 12:00:00 AM
Firstpage :
49
Lastpage :
56
Keywords :
Authorization; Automatic testing; Laboratories; Life testing; Materials reliability; Production; System testing; Temperature; Time measurement; Voltage;
fLanguage :
English
Journal_Title :
Reliability and Quality Control, IRE Transactions on
Publisher :
ieee
ISSN :
0097-4552
Type :
jour
DOI :
10.1109/IRE-PGRQC.1957.5007133
Filename :
5007133
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=942530
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