Title :
Success Story - Transistor Reliability - 1956
Author :
Zierdt, C.H., Jr.
Author_Institution :
General Electric Company, Syracuse, New York
fDate :
6/1/1957 12:00:00 AM
Keywords :
Atmosphere; Degradation; Electric variables; Feedback circuits; Germanium; Manufacturing industries; Production; Quality control; Silicon; Testing;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1957.5007134
