Title :
YBCO thin films for microwave applications by post-annealing at low oxygen partial pressure with F monitoring
Author :
Mogro-Campero, A. ; Turner, L.G. ; Kadin, A.M. ; Mallory, D.S.
Author_Institution :
GE Res. & Dev. Center, Schenectady, NY, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
YBa/sub 2/Cu/sub 3/O/sub 7/ thin films postannealed at low oxygen partial pressure are shown to exhibit improved properties compared to equivalent samples postannealed in 1 atm of oxygen. The magnetic penetration depth of these films has been measured and is shown to be a factor of 2 lower at low temperatures for the samples postannealed at low oxygen partial pressure, consistent with the lower value of surface resistance found for these samples. It is also shown that the eddy-current response at megahertz frequencies can be used as a rapid qualitative test to select samples with good microwave properties.<>
Keywords :
annealing; barium compounds; eddy currents; high-frequency effects; high-temperature superconductors; penetration depth (superconductivity); superconducting thin films; surface conductivity; yttrium compounds; 1 atm; 77 K; F monitoring; O/sub 2/ partial pressure; YBCO thin films; YBa/sub 2/Cu/sub 3/O/sub 7/ thin films; eddy-current response; magnetic penetration depth; megahertz frequencies; microwave applications; microwave properties; post-annealing; surface resistance; Annealing; Electrical resistance measurement; Frequency; Magnetic films; Oxygen; Solids; Surface resistance; Temperature dependence; Transistors; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
