Title :
On the Measurement of Component Reliability
Author_Institution :
Defense Electronics Products Division, Radio Corporation of America, Camden, New Jersey
Keywords :
Capacitors; Current measurement; Extrapolation; Life estimation; Life testing; Resistors; Shape; Stress measurement; Temperature control; Voltage control;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1957.5007143
