DocumentCode
942899
Title
YBa/sub 2/Cu/sub 3/O/sub 7- delta //LaAlO/sub 3//YBa/sub 2/Cu/sub 3/O/sub 7- delta / trilayer transmission lines for measuring the superconducting penetration depth
Author
Pond, J.M. ; Carroll, K.R. ; Horwitz, J.S. ; Chrisey, D.B.
Author_Institution
US Naval Res. Lab., Washington, DC, USA
Volume
3
Issue
1
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
1438
Lastpage
1441
Abstract
Microstrip transmission lines fabricated from two YBa/sub 2/Cu/sub 3/O/sub 7- delta / films separated by a deposited LaAlO/sub 3/ dielectric film provide a technique for measuring the penetration depth. When weakly coupled to a microwave signal, this structure permits precise measurements of the resonant frequencies. The absolute value of the penetration depth as a function of temperature can be calculated from the phase velocity. With this method, there is no need to assume a particular functional form for the temperature dependence. The sensitivities of this method to possible asymmetries in the superconducting film properties and uncertainties in the dielectric constant have also been analyzed. Recently reported microwave measurements are analyzed.<>
Keywords
barium compounds; high-temperature superconductors; lanthanum compounds; microstrip lines; penetration depth (superconductivity); permittivity measurement; superconducting junction devices; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 7- delta /-LaAlO/sub 3/-YBa/sub 2/Cu/sub 3/O/sub 7- delta /; deposited LaAlO/sub 3/ dielectric film; dielectric constant; film properties; high temperature superconductors; microstrip; microwave measurements; microwave signal; phase velocity; resonant frequencies; superconducting penetration depth; temperature dependence; trilayer transmission lines; Couplings; Dielectric films; Dielectric measurements; Frequency measurement; Microstrip; Microwave measurements; Resonant frequency; Superconducting transmission lines; Temperature sensors; Transmission line measurements;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.233626
Filename
233626
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