Title :
A universal de-embedding procedure for the "on-wafer" GHz probing
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
fDate :
9/1/1995 12:00:00 AM
Abstract :
A novel de-embedding procedure for "on-wafer" GHz probing is presented. The parasitic effects arising from the bond-pads are modeled generally by two-port networks. Thus, no equivalent circuit details are required. Even the transmission line effects occurring at extremely high frequencies can be taken into account in this model.
Keywords :
MIMIC; MMIC; S-parameters; crosstalk; integrated circuit testing; microwave measurement; millimetre wave measurement; two-port networks; bond-pads; onwafer GHz probing; parasitic effects modelling; transmission line effects; two-port networks; universal de-embedding procedure; Bonding; Contacts; Crosstalk; Distributed parameter circuits; Equivalent circuits; Error correction; Feeds; Frequency; Propagation losses; Transmission line matrix methods;
Journal_Title :
Electron Devices, IEEE Transactions on
