• DocumentCode
    942983
  • Title

    Laser-induced line melting and cutting

  • Author

    Cohen, Simon S. ; Bernstein, Joseph B. ; Wyatt, Peter W.

  • Author_Institution
    MIT Lincoln Lab., Lexington, MA, USA
  • Volume
    39
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    2480
  • Lastpage
    2485
  • Abstract
    The application of pulsed laser radiation in the melting and cutting of VLSI conducting lines is studied. These processes are used to realize both deletive and additive redundancy techniques, common in defect avoidance and customization processes. The authors discuss the theory of laser-beam application of aluminum lines, and show how the various beam and substrate parameters affect the properties of the irradiated zone. Closed-form analytical expression have been obtained for the relevant quantities. No adjustable parameters are involved in the calculation of the various thermal properties. An analytical examination of the resulting molten zone properties has been performed in order to fully quantify the use of laser melting in customization and wafer-scale applications. The experimental results compare well with the theoretical predictions
  • Keywords
    VLSI; laser beam applications; redundancy; Al lines; additive redundancy; analytical expression; customization processes; defect avoidance; experimental results; laser line cutting; laser line joining; laser line melting; laser linking; laser melting; pulsed laser radiation; repair; wafer-scale applications; Additives; Electrons; Equations; Integrated circuit interconnections; Laser applications; Laser beam cutting; Laser modes; Laser theory; Optical pulses; Wire;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.163461
  • Filename
    163461