Title :
Utilization of Component Part Reliability Information in Circuit Design
Author :
Xavier, M.A. ; Schneider, L.L. ; Gottfried, P.
Author_Institution :
Inland Testing Laboratories, Division of Cook Electric Company, Morton Grove, Illinois
Abstract :
Component part reliability testing programs of varying scope are in progress in many areas of the electronics industry today. These programs differ in magnitude, levels of environmental and electrical stress, and types of component parts tested, but properly designed programs have one aspect in common: They can result not only in reliability evaluation, but also in reliability improvement. This paper will discuss techniques for optimizing circuit reliability by application of component characteristic data obtained from reliability testing.
Keywords :
Circuit synthesis; Circuit testing; Design engineering; Electronic equipment testing; Electronics industry; Industrial electronics; Laboratories; Life testing; Manufacturing; Stress;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1958.5007185