Title :
Comments on "Threshold voltage model for deep-submicrometer MOSFETs
Author :
Iníguez, Benjamín
Author_Institution :
Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
Abstract :
For the original article see ibid., vol. 40, no. 1, p. 86-94 (1993). From the analytical solution of Poisson´s equation in the depletion layer of a MOSFET in weak inversion, the commenter finds an exact expression of the threshold voltage, valid for all drain biases and channel lengths (if they are greater than the minimum acceptable value) using the same procedure as in the aforementioned paper by Z.-H. Liu et al.<>
Keywords :
MOSFET; semiconductor device models; Poisson equation; deep-submicron MOSFET; depletion layer; threshold voltage model; weak inversion; MOSFETs; Physics; Poisson equations; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on