Title :
Investigation of in-situ Ag/YBCO contacts for SNS devices
Author :
Robertazzi, R.P. ; Kleinsasser, A.W. ; Laibowitz, R.B. ; Koch, R.H. ; Stawiasz, K.G.
Author_Institution :
IBM Res. Div., Yorktown Heights, NY, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
Using a completely in-situ process, the authors have investigated Ag metal contacts to thin films of Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7/, in order to study the properties of the Ag/YBCO interface as well as the Josephson effect in SNS (superconductor-normal-superconductor) bridges made with this technique. Measurements of the temperature dependence of the Josephson current in these devices have been made and are compared to recent theoretical predictions. SNS devices which exhibited Josephson effects had the critical-current-resistance products of the junctions limited by the high specific contact resistance of the SN interfaces. The lowest values of the specific contact resistance obtained were on the order of 10/sup -8/ Omega -cm/sup 2/ for contacts in the c-axis direction. The influence of the specific contact resistance on the magnitude of the Josephson current in SNS bridges is discussed.<>
Keywords :
Josephson effect; barium compounds; high-temperature superconductors; silver; superconducting junction devices; superconductive tunnelling; yttrium compounds; Ag metal contacts; Josephson current; Josephson effect; SNS devices; YBa/sub 2/Cu/sub 3/O/sub 7/-Ag; critical-current-resistance products; high specific contact resistance; high temperature superconductor; superconductor-normal-superconductor; thin films; Bridges; Contact resistance; Current measurement; Electrical resistance measurement; Josephson effect; Josephson junctions; Superconducting devices; Superconducting thin films; Temperature measurement; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
