Fabrication of YBa/sub 2/Cu/sub 3/O/sub 7//AlO/sub x//Nb quasiparticle tunnel junctions

Author

Lee, S.G. ; Lee, Y.H. ; Kwon, H.C. ; Park, K. ; Park, Y.K. ; Park, J.C.

Author_Institution

Korea Res. Inst. of Stand. & Sci., Taejon, South Korea

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

1305

Lastpage

1307

Abstract

The authors have fabricated superconductor-insulator-normal metal (SIN) tunnel junctions with c-axis-oriented YBCO thin films as the superconducting electrodes and studied the tunneling characteristics of the junctions by measuring the zero-bias junction resistance as a function of temperature and dI/dV as a function of the bias voltage. Measured junction resistance showed characteristic tunneling properties with a strong semiconducting background, which is ascribed to the imperfect tunnel barrier. dI/dV curves indicated gap structures at 27 mV and 4.5 mV, respectively, with a parabolic background.<>

Keywords

aluminium compounds; barium compounds; high-temperature superconductors; niobium; superconductive tunnelling; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 7/-AlO/sub x/-Nb; high temperature superconductor; quasiparticle tunnel junctions; superconductor-insulator-normal metal; tunneling characteristics; zero-bias junction resistance; Electrical resistance measurement; Electrodes; Fabrication; Josephson junctions; Silicon compounds; Superconducting thin films; Temperature; Tunneling; Voltage; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233661

Filename

233661