Title :
Calculations of the Risk of Component Applications in Electronic Systems
Author_Institution :
Defense Electronic Products, RCA, Camden, New Jersey
Keywords :
Circuits; Costs; Design engineering; Failure analysis; Insurance; Radar equipment; Reliability engineering; Resistors; Stress; Transfer functions;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1957.5007231
