Title :
NDT applications of scanning acoustic microscopy
Author :
Burton, Nigel J.
Author_Institution :
VG Semicon Ltd., The Birches Industrial Estate, East Grinstead, UK
fDate :
3/1/1987 12:00:00 AM
Abstract :
The scanning acoustic microscope is becoming an important new tool for nondestructive testing. The paper concentrates on the current application of the technique and recent developments in instrumentation relevant to the NDT field: an area not well covered in the literature
Keywords :
acoustic microscopy; nondestructive testing; NDT; scanning acoustic microscopy;
Journal_Title :
Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A
DOI :
10.1049/ip-a-1.1987.0037
