• DocumentCode
    944470
  • Title

    NDT applications of scanning acoustic microscopy

  • Author

    Burton, Nigel J.

  • Author_Institution
    VG Semicon Ltd., The Birches Industrial Estate, East Grinstead, UK
  • Volume
    134
  • Issue
    3
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    283
  • Lastpage
    289
  • Abstract
    The scanning acoustic microscope is becoming an important new tool for nondestructive testing. The paper concentrates on the current application of the technique and recent developments in instrumentation relevant to the NDT field: an area not well covered in the literature
  • Keywords
    acoustic microscopy; nondestructive testing; NDT; scanning acoustic microscopy;
  • fLanguage
    English
  • Journal_Title
    Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A
  • Publisher
    iet
  • ISSN
    0143-702X
  • Type

    jour

  • DOI
    10.1049/ip-a-1.1987.0037
  • Filename
    4647905